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Neutron and X-ray Optics

Neutron and X-ray Optics
  • Author : Jay Theodore Cremer, Jr.
  • Publisher :Unknown
  • Release Date :2013-02-18
  • Total pages :1124
  • ISBN : 9780124071599
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Summary : Covering a wide range of topics related to neutron and x-ray optics, this book explores the aspects of neutron and x-ray optics and their associated background and applications in a manner accessible to both lower-level students while retaining the detail necessary to advanced students and researchers. It is a self-contained book with detailed mathematical derivations, background, and physical concepts presented in a linear fashion. A wide variety of sources were consulted and condensed to provide detailed derivations and coverage of the topics of neutron and x-ray optics as well as the background material needed to understand the physical and mathematical reasoning directly related or indirectly related to the theory and practice of neutron and x-ray optics. The book is written in a clear and detailed manner, making it easy to follow for a range of readers from undergraduate and graduate science, engineering, and medicine. It will prove beneficial as a standalone reference or as a complement to textbooks. Supplies a historical context of covered topics. Detailed presentation makes information easy to understand for researchers within or outside the field. Incorporates reviews of all relevant literature in one convenient resource.

Modern Developments in X-Ray and Neutron Optics

Modern Developments in X-Ray and Neutron Optics
  • Author : Alexei Erko,Mourad Idir,Thomas Krist,Alan G. Michette
  • Publisher :Unknown
  • Release Date :2008-04-01
  • Total pages :534
  • ISBN : 9783540745617
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Summary : This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006.

Soft X-ray Optics

Soft X-ray Optics
  • Author : Eberhard Spiller
  • Publisher :Unknown
  • Release Date :1994
  • Total pages :278
  • ISBN : 0819416541
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Summary : This text describes optics mainly in the 10 to 500 angstrom wavelength region. These wavelengths are 50 to 100 times shorter than those for visible light and 50 to 100 times longer than the wavelengths of medical x rays or x-ray diffraction from natural crystals. There have been substantial advances during the last 20 years, which one can see as an extension of optical technology to shorter wavelengths or as an extension of x-ray diffraction to longer wavelengths. Artificial diffracting structures like zone plates and multilayer mirrors are replacing the natural crystals of x-ray diffraction. Some of these structures can now be fabricated to have diffraction-limited resolution. The new possibilities are described in a simple, tutorial way.

X-Ray and Neutron Reflectivity: Principles and Applications

X-Ray and Neutron Reflectivity: Principles and Applications
  • Author : Jean Daillant,Alain Gibaud
  • Publisher :Unknown
  • Release Date :2003-07-01
  • Total pages :331
  • ISBN : 9783540486961
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Summary : The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

X-Ray and Neutron Diffraction in Nonideal Crystals

X-Ray and Neutron Diffraction in Nonideal Crystals
  • Author : Mikhail A. Krivoglaz
  • Publisher :Unknown
  • Release Date :2012-12-06
  • Total pages :466
  • ISBN : 9783642742910
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Summary : Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter ing of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first mono graph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two volume monograph published in Russian in 1983-84 (this edition is the revised translation of the latter).

X-Ray Optics

X-Ray Optics
  • Author : Yuri Shvyd'ko
  • Publisher :Unknown
  • Release Date :2013-11-11
  • Total pages :406
  • ISBN : 9783540408901
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Summary : The use of x rays has moved in the forefront of science and technology in the second half of the 20th century. This progress has been greatly stimulated by the advent of synchrotron x-ray sources in the 1960s. The undulator-based synchrotron radiation sources which have appeared in the last decade of the 20th century gave a new impetus to such development. The brilliance of the x-ray sources has increased by 12 orders of magnitude in 40 years and this trend does not show any signs of stagnation. The future x-ray sources of the 21th century based on free-electron lasers driven by linear accelerators will provide sub-picosecond radiation pulses with by many orders of magnitude higher brilliance and full transverse coherence. The x-ray sources of the newest generation offer a possibility to realize more than ever before the great potential of x-ray optics and, as a consequence, to elaborate new sophisticated instrumentation with unprecedented resolution and eventually to move in new directions of research in x-ray technology, materials science, fundamental physics, life sciences, etc.

FY 1996 TA/NIST Budget Authorization

FY 1996 TA/NIST Budget Authorization
  • Author : United States. Congress. House. Committee on Science. Subcommittee on Technology
  • Publisher :Unknown
  • Release Date :1995
  • Total pages :435
  • ISBN : PSU:000024129756
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Summary :

Hard X-ray/gamma-ray and Neutron Optics, Sensors, and Applications

Hard X-ray/gamma-ray and Neutron Optics, Sensors, and Applications
  • Author : Richard B. Hoover,F. Patrick Doty,Society of Photo-optical Instrumentation Engineers
  • Publisher :Unknown
  • Release Date :1996
  • Total pages :322
  • ISBN : UOM:39015038521475
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Summary :

Handbook of Optics, Third Edition Volume V: Atmospheric Optics, Modulators, Fiber Optics, X-Ray and Neutron Optics

Handbook of Optics, Third Edition Volume V: Atmospheric Optics, Modulators, Fiber Optics, X-Ray and Neutron Optics
  • Author : Michael Bass,Casimer DeCusatis,Jay Enoch,Vasudevan Lakshminarayanan,Guifang Li,Carolyn MacDonald,Virendra Mahajan,Eric Van Stryland
  • Publisher :Unknown
  • Release Date :2009-11-13
  • Total pages :1280
  • ISBN : 9780071633147
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Summary : The most comprehensive and up-to-date optics resource available Prepared under the auspices of the Optical Society of America, the five carefully architected and cross-referenced volumes of the Handbook of Optics, Third Edition, contain everything a student, scientist, or engineer requires to actively work in the field. From the design of complex optical systems to world-class research and development methods, this definitive publication provides unparalleled access to the fundamentals of the discipline and its greatest minds. Individual chapters are written by the world's most renowned experts who explain, illustrate, and solve the entire field of optics. Each volume contains a complete chapter listing for the entire Handbook, extensive chapter glossaries, and a wealth of references. This pioneering work offers unprecedented coverage of optics data, techniques, and applications. Volume V covers atmospheric optics, modulators, fiber optics, and x-ray and neutron optics.

X-Ray and Neutron Dynamical Diffraction

X-Ray and Neutron Dynamical Diffraction
  • Author : André Authier,Stefano Lagomarsino,Brian K. Tanner
  • Publisher :Unknown
  • Release Date :2012-12-06
  • Total pages :419
  • ISBN : 9781461558798
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Summary : This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

Energy Research Abstracts

Energy Research Abstracts
  • Author : Anonim
  • Publisher :Unknown
  • Release Date :1990
  • Total pages :229
  • ISBN : MSU:31293010869141
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Summary :

Neutron Imaging and Applications

Neutron Imaging and Applications
  • Author : Ian S. Anderson,Robert McGreevy,Hassina Z. Bilheux
  • Publisher :Unknown
  • Release Date :2009-04-21
  • Total pages :341
  • ISBN : 0387786937
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Summary : Neutron Imaging and Applications offers an introduction to the basics of neutron beam production in addition to the wide scope of techniques that enhance imaging application capabilities. An instructional overview of neutron sources, detectors, optics and spin-filters allows readers to delve more deeply into the discussions of radiography, tomography and prospective applications available in neutron holography techniques. A section devoted to current applications describes imaging single grains in polycrystalline materials, neutron imaging of geological materials and other materials science and engineering areas. Coverage of thermal neutron imaging of biological tissues, plant physiology, Homeland Security and contraband detection explore the future prospects of this cutting-edge research. Written by key experts in the field, researchers and engineers involved with imaging technologies will find Neutron Imaging and Applications a valuable reference.

Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics
  • Author : Anonim
  • Publisher :Unknown
  • Release Date :2020-03-18
  • Total pages :344
  • ISBN : 9780128209981
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Summary : Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing

X-Ray and Neutron Structure Analysis in Materials Science

X-Ray and Neutron Structure Analysis in Materials Science
  • Author : J. Hasek
  • Publisher :Unknown
  • Release Date :1989-07
  • Total pages :406
  • ISBN : UOM:39015012006519
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Summary : Proceedings held Oct. 1987. Present volume treats the following topics: powder diffraction analysis; real structure of crystalline materials; polycrystal thin layers; diffraction analysis of amorphous materials, glasses and polymers; single crystal thin layers; crystal structure determination; data

X-ray and Neutron Scattering from Surfaces and Thin Films

X-ray and Neutron Scattering from Surfaces and Thin Films
  • Author : M. Bienfait,J. M. Gay
  • Publisher :Unknown
  • Release Date :1989
  • Total pages :304
  • ISBN : UCLA:L0065842155
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Summary :

Remote Compositional Analysis

Remote Compositional Analysis
  • Author : Janice L. Bishop,James F. Bell III,Jeffrey E. Moersch
  • Publisher :Unknown
  • Release Date :2019-11-30
  • Total pages :666
  • ISBN : 9781107186200
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Summary : Comprehensive overview of the spectroscopic, mineralogical, and geochemical techniques used in planetary remote sensing.

Chemical Abstracts

Chemical Abstracts
  • Author : Anonim
  • Publisher :Unknown
  • Release Date :2002
  • Total pages :229
  • ISBN : UOM:39015057321377
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Summary :

Particles and Waves in Electron Optics and Microscopy

Particles and Waves in Electron Optics and Microscopy
  • Author : Anonim
  • Publisher :Unknown
  • Release Date :2016-05-27
  • Total pages :358
  • ISBN : 9780128052303
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Summary : Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Advances in Multilayer and Grazing Incidence X-ray/EUV/FUV Optics

Advances in Multilayer and Grazing Incidence X-ray/EUV/FUV Optics
  • Author : Richard B. Hoover,A. B. C. Walker
  • Publisher :Unknown
  • Release Date :1994
  • Total pages :554
  • ISBN : UOM:39015032352604
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Summary :

Methods of Experimental Physics

Methods of Experimental Physics
  • Author : Gerald Ehrenstein,Harold Lecar
  • Publisher :Unknown
  • Release Date :1982
  • Total pages :568
  • ISBN : 0124759629
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Summary :

X-ray Optics Design, Performance, and Applications

X-ray Optics Design, Performance, and Applications
  • Author : Ali M. Khounsary
  • Publisher :Unknown
  • Release Date :1999
  • Total pages :362
  • ISBN : UOM:39015048852381
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Summary :