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System-on-Chip Test Architectures

System-on-Chip Test Architectures
  • Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
  • Publisher :Unknown
  • Release Date :2010-07-28
  • Total pages :896
  • ISBN : 0080556809
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Summary : Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures
  • Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
  • Publisher :Unknown
  • Release Date :2006-08-14
  • Total pages :808
  • ISBN : 0080474799
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Summary : This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization
  • Author : Erik Larsson
  • Publisher :Unknown
  • Release Date :2006-03-30
  • Total pages :388
  • ISBN : 9780387256245
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Summary : SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Design and Test Technology for Dependable Systems-on-chip

Design and Test Technology for Dependable Systems-on-chip
  • Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
  • Publisher :Unknown
  • Release Date :2011-01-01
  • Total pages :550
  • ISBN : 9781609602147
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Summary : "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

System-on-Chip for Real-Time Applications

System-on-Chip for Real-Time Applications
  • Author : Wael Badawy,Graham A. Julien
  • Publisher :Unknown
  • Release Date :2002-10-31
  • Total pages :456
  • ISBN : 1402072546
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Summary : System-on-Chip for Real-Time Applications will be of interest to engineers, both in industry and academia, working in the area of SoC VLSI design and application. It will also be useful to graduate and undergraduate students in electrical and computer engineering and computer science. A selected set of papers from the 2nd International Workshop on Real-Time Applications were used to form the basis of this book. It is organized into the following chapters: -Introduction; -Design Reuse; -Modeling; -Architecture; -Design Techniques; -Memory; -Circuits; -Low Power; -Interconnect and Technology; -MEMS. System-on-Chip for Real-Time Applications contains many signal processing applications and will be of particular interest to those working in that community.

ARM System-on-chip Architecture

ARM System-on-chip Architecture
  • Author : Stephen Bo Furber
  • Publisher :Unknown
  • Release Date :2000
  • Total pages :419
  • ISBN : 0201675196
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Summary : A reference for system-on-chip designers and professional engineers covers design, memory management, on-chip buses, debug and production tests, application development, and ARM and Thumb programming models.

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
  • Author : Krishnendu Chakrabarty
  • Publisher :Unknown
  • Release Date :2013-04-17
  • Total pages :200
  • ISBN : 9781475765274
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Summary : System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

VLSI-SoC: Advanced Topics on Systems on a Chip

VLSI-SoC: Advanced Topics on Systems on a Chip
  • Author : Ricardo Reis,Vincent Mooney,Paul Hasler
  • Publisher :Unknown
  • Release Date :2009-04-13
  • Total pages :290
  • ISBN : 9780387895574
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Summary : This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5 and by the IEEE Council on Electronic Design Automation (CEDA), is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SoC conferences aim to address these exciting new issues.

System-on-a-chip

System-on-a-chip
  • Author : Rochit Rajsuman
  • Publisher :Unknown
  • Release Date :2000
  • Total pages :277
  • ISBN : UOM:39015050193153
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Summary : Starting with a basic overview of system-on-a-chip (SoC), including definitions of related terms, this new book helps you understand SoC design challenges, and the latest design and test methodologies. You see how ASIC technology evolved to an embedded cores-based concept that includes pre-designed, reusable Intellectual Property (IP) cores that act as microprocessors, data storage devices, DSP, bus control, and interfaces -- all "stitched" together by a User's Defined Logic (UDL).

Test Resource Partitioning for System-on-a-Chip

Test Resource Partitioning for System-on-a-Chip
  • Author : Krishnendu Chakrabarty,Vikram Iyengar,Anshuman Chandra
  • Publisher :Unknown
  • Release Date :2002-06-30
  • Total pages :232
  • ISBN : 1402071191
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Summary : Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.

On-Chip Communication Architectures

On-Chip Communication Architectures
  • Author : Sudeep Pasricha,Nikil Dutt
  • Publisher :Unknown
  • Release Date :2010-07-28
  • Total pages :544
  • ISBN : 0080558283
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Summary : Over the past decade, system-on-chip (SoC) designs have evolved to address the ever increasing complexity of applications, fueled by the era of digital convergence. Improvements in process technology have effectively shrunk board-level components so they can be integrated on a single chip. New on-chip communication architectures have been designed to support all inter-component communication in a SoC design. These communication architecture fabrics have a critical impact on the power consumption, performance, cost and design cycle time of modern SoC designs. As application complexity strains the communication backbone of SoC designs, academic and industrial R&D efforts and dollars are increasingly focused on communication architecture design. On-Chip Communication Architecures is a comprehensive reference on concepts, research and trends in on-chip communication architecture design. It will provide readers with a comprehensive survey, not available elsewhere, of all current standards for on-chip communication architectures. A definitive guide to on-chip communication architectures, explaining key concepts, surveying research efforts and predicting future trends Detailed analysis of all popular standards for on-chip communication architectures Comprehensive survey of all research on communication architectures, covering a wide range of topics relevant to this area, spanning the past several years, and up to date with the most current research efforts Future trends that with have a significant impact on research and design of communication architectures over the next several years

Algorithms in Ambient Intelligence

Algorithms in Ambient Intelligence
  • Author : W. Verhaegh,Wim Verhaegh,Emile Aarts,Jan Korst
  • Publisher :Unknown
  • Release Date :2004
  • Total pages :341
  • ISBN : 140201757X
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Summary : This book is the outcome of a series of discussions at the Philips Symposium on Intelligent Algorithms, which was held in Eindhoven on December 2002. It contains many exciting and practical examples from this newly developing research field, which can be positioned at the intersection of computer science, discrete mathematics, and artificial intelligence. The examples include machine learning, content management, vision, speech, content augmentation, profiling, music retrieval, feature extraction, audio and video fingerprinting, resource management, multimedia servers, network scheduling, and IC design.

Network-on-Chip

Network-on-Chip
  • Author : Santanu Kundu,Santanu Chattopadhyay
  • Publisher :Unknown
  • Release Date :2018-09-03
  • Total pages :388
  • ISBN : 9781466565272
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Summary : Addresses the Challenges Associated with System-on-Chip Integration Network-on-Chip: The Next Generation of System-on-Chip Integration examines the current issues restricting chip-on-chip communication efficiency, and explores Network-on-chip (NoC), a promising alternative that equips designers with the capability to produce a scalable, reusable, and high-performance communication backbone by allowing for the integration of a large number of cores on a single system-on-chip (SoC). This book provides a basic overview of topics associated with NoC-based design: communication infrastructure design, communication methodology, evaluation framework, and mapping of applications onto NoC. It details the design and evaluation of different proposed NoC structures, low-power techniques, signal integrity and reliability issues, application mapping, testing, and future trends. Utilizing examples of chips that have been implemented in industry and academia, this text presents the full architectural design of components verified through implementation in industrial CAD tools. It describes NoC research and developments, incorporates theoretical proofs strengthening the analysis procedures, and includes algorithms used in NoC design and synthesis. In addition, it considers other upcoming NoC issues, such as low-power NoC design, signal integrity issues, NoC testing, reconfiguration, synthesis, and 3-D NoC design. This text comprises 12 chapters and covers: The evolution of NoC from SoC—its research and developmental challenges NoC protocols, elaborating flow control, available network topologies, routing mechanisms, fault tolerance, quality-of-service support, and the design of network interfaces The router design strategies followed in NoCs The evaluation mechanism of NoC architectures The application mapping strategies followed in NoCs Low-power design techniques specifically followed in NoCs The signal integrity and reliability issues of NoC The details of NoC testing strategies reported so far The problem of synthesizing application-specific NoCs Reconfigurable NoC design issues Direction of future research and development in the field of NoC Network-on-Chip: The Next Generation of System-on-Chip Integration covers the basic topics, technology, and future trends relevant to NoC-based design, and can be used by engineers, students, and researchers and other industry professionals interested in computer architecture, embedded systems, and parallel/distributed systems.

Reliability, Availability and Serviceability of Networks-on-Chip

Reliability, Availability and Serviceability of Networks-on-Chip
  • Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
  • Publisher :Unknown
  • Release Date :2011-09-23
  • Total pages :209
  • ISBN : 1461407915
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Summary : This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Processor Design

Processor Design
  • Author : Jari Nurmi
  • Publisher :Unknown
  • Release Date :2007-07-26
  • Total pages :526
  • ISBN : 9781402055300
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Summary : Here is an extremely useful book that provides insight into a number of different flavors of processor architectures and their design, software tool generation, implementation, and verification. After a brief introduction to processor architectures and how processor designers have sometimes failed to deliver what was expected, the authors introduce a generic flow for embedded on-chip processor design and start to explore the vast design space of on-chip processing. The authors cover a number of different types of processor core.

System-level Test and Validation of Hardware/Software Systems

System-level Test and Validation of Hardware/Software Systems
  • Author : Matteo Sonza Reorda,Zebo Peng,Massimo Violante
  • Publisher :Unknown
  • Release Date :2005-04-07
  • Total pages :179
  • ISBN : 1852338997
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Summary : New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.

Designing Network On-Chip Architectures in the Nanoscale Era

Designing Network On-Chip Architectures in the Nanoscale Era
  • Author : Jose Flich,Davide Bertozzi
  • Publisher :Unknown
  • Release Date :2010-12-18
  • Total pages :528
  • ISBN : 9781439837115
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Summary : Going beyond isolated research ideas and design experiences, Designing Network On-Chip Architectures in the Nanoscale Era covers the foundations and design methods of network on-chip (NoC) technology. The contributors draw on their own lessons learned to provide strong practical guidance on various design issues. Exploring the design process of the network, the first part of the book focuses on basic aspects of switch architecture and design, topology selection, and routing implementation. In the second part, contributors discuss their experiences in the industry, offering a roadmap to recent products. They describe Tilera’s TILE family of multicore processors, novel Intel products and research prototypes, and the TRIPS operand network (OPN). The last part reveals state-of-the-art solutions to hardware-related issues and explains how to efficiently implement the programming model at the network interface. In the appendix, the microarchitectural details of two switch architectures targeting multiprocessor system-on-chips (MPSoCs) and chip multiprocessors (CMPs) can be used as an experimental platform for running tests. A stepping stone to the evolution of future chip architectures, this volume provides a how-to guide for designers of current NoCs as well as designers involved with 2015 computing platforms. It cohesively brings together fundamental design issues, alternative design paradigms and techniques, and the main design tradeoffs—consistently focusing on topics most pertinent to real-world NoC designers.

Essential Issues in SOC Design

Essential Issues in SOC Design
  • Author : Youn-Long Steve Lin
  • Publisher :Unknown
  • Release Date :2007-05-31
  • Total pages :403
  • ISBN : 9781402053528
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Summary : This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

Arithmetic Built-in Self-test for Embedded Systems

Arithmetic Built-in Self-test for Embedded Systems
  • Author : Janusz Rajski,Jerzy Tyszer
  • Publisher :Unknown
  • Release Date :1998
  • Total pages :268
  • ISBN : UOM:39015040569207
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Summary : Arithmetic Built-In Self-Test for Embedded Systems offers a thorough treatment of the important issues in software-based built-in self-test for systems with embedded processors. Fundamental concepts are illustrated with practical scenarios for test generation, test application, and test response compaction. Arithmetic Built-In Self-Test for Embedded Systems uses an approach to cutting-edge technology that will be of interest to hardware and embedded system designers, test and design engineers, and researchers working on IC/core testing. It is also appropriate for graduate-level design courses. An introductory chapter provides a comprehensive tutorial covering the most relevant DFT and BIST techniques.

The VLSI Handbook

The VLSI Handbook
  • Author : Wai-Kai Chen
  • Publisher :Unknown
  • Release Date :2018-10-03
  • Total pages :2320
  • ISBN : 9781420005967
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Summary : For the new millenium, Wai-Kai Chen introduced a monumental reference for the design, analysis, and prediction of VLSI circuits: The VLSI Handbook. Still a valuable tool for dealing with the most dynamic field in engineering, this second edition includes 13 sections comprising nearly 100 chapters focused on the key concepts, models, and equations. Written by a stellar international panel of expert contributors, this handbook is a reliable, comprehensive resource for real answers to practical problems. It emphasizes fundamental theory underlying professional applications and also reflects key areas of industrial and research focus. WHAT'S IN THE SECOND EDITION? Sections on... Low-power electronics and design VLSI signal processing Chapters on... CMOS fabrication Content-addressable memory Compound semiconductor RF circuits High-speed circuit design principles SiGe HBT technology Bipolar junction transistor amplifiers Performance modeling and analysis using SystemC Design languages, expanded from two chapters to twelve Testing of digital systems Structured for convenient navigation and loaded with practical solutions, The VLSI Handbook, Second Edition remains the first choice for answers to the problems and challenges faced daily in engineering practice.

Electronic Design Automation

Electronic Design Automation
  • Author : Laung-Terng Wang,Yao-Wen Chang,Kwang-Ting (Tim) Cheng
  • Publisher :Unknown
  • Release Date :2009-03-11
  • Total pages :972
  • ISBN : 0080922007
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Summary : This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes